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18
4109LS–8051–02/08
AT8xC51SND1C
7.
Electrical Characteristics
7.1
Absolute Maximum Rating
7.2
DC Characteristics
7.2.1
Digital Logic
Storage Temperature ......................................... -65 to +150°C
Voltage on any other Pin to V
SS .................................... -0.3 to +4.0 V
I
OL per I/O Pin ................................................................. 5 mA
Power Dissipation ............................................................. 1 W
Operating Conditions
Ambient Temperature Under Bias........................ -40 to +85°C
V
DD ........................................................................................................................4.0V
*NOTICE:
Stressing the device beyond the “Absolute Maxi-
mum Ratings” may cause permanent damage.
These are stress ratings only. Operation beyond
the “operating conditions” is not recommended
and extended exposure beyond the “Operating
Conditions” may affect device reliability.
Table 16. Digital DC Characteristics
VDD = 2.7 to 3.3 V, TA = -40 to +85°C
Symbol
Parameter
Min
Typ(1)
Max
Units
Test Conditions
V
IL
Input Low Voltage
-0.5
0.2V
DD - 0.1
V
IH1
(2)
Input High Voltage (except RST, X1)
0.2V
DD + 1.1
V
DD
V
IH2
Input High Voltage (RST, X1)
0.7V
DD
V
DD + 0.5
V
OL1
Output Low Voltage
(except P0, ALE, MCMD, MDAT, MCLK,
SCLK, DCLK, DSEL, DOUT)
0.45
V
I
OL= 1.6 mA
V
OL2
Output Low Voltage
(P0, ALE, MCMD, MDAT, MCLK, SCLK,
DCLK, DSEL, DOUT)
0.45
V
I
OL= 3.2 mA
V
OH1
Output High Voltage
(P1, P2, P3, P4 and P5)
V
DD - 0.7
V
I
OH= -30 A
VOH2
Output High Voltage
(P0, P2 address mode, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT, D+, D-)
VDD - 0.7
V
IOH= -3.2 mA
I
IL
Logical 0 Input Current (P1, P2, P3, P4
and P5)
-50
A
V
IN= 0.45 V
ILI
Input Leakage Current (P0, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT)
10
A
0.45< VIN< VDD
ITL
Logical 1 to 0 Transition Current
(P1, P2, P3, P4 and P5)
-650
A
VIN= 2.0 V
R
RST
Pull-Down Resistor
50
90
200
k
C
IO
Pin Capacitance
10
pF
T
A= 25°C
V
RET
V
DD Data Retention Limit
1.8
V
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